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Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability | NIST
Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability | NIST
1997
Jun-Feng Song
Samuel R Low
David J. Pitchure
Alessandro Germak
Sergio Desogus
Thomas Polzin
H. Yang
H. Ishida
Giulio Barbato
Keywords:
Physics
Manufacturing engineering
Traceability
Optics
NIST
Metrology
Rockwell scale
Systems engineering
Correction
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