Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research
2014
Ray-tracing algorithms are used to simulate the instrumental function of a synchrotron beamline targeted to the advanced
characterization of nanocrystalline materials by powder diffraction. The characteristics of the source, a bending magnet
in the present case of study, and the optics influence the instrumental profile, which is a key parameter for obtaining
information on the nanostructure.
We combine the SHADOW simulation with the calculation of powder diffraction profiles from standard materials, into a
high-level workflow environment based on the ORANGE software, allowing us to integrate data analysis fitting software
with realistic information.
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