Crystal orientation in poly(ethylene 2,6-naphthalate) ultrathin films revealed by reflection–absorption infrared spectroscopy and grazing incidence X-ray diffraction

Abstract Crystal orientation of poly(ethylene 2, 6-naphthalate) (PEN) ultrathin films was investigated by the combination of reflection–absorption infrared spectroscopy (RAIR) and grazing incidence X-ray diffraction (GIXD) techniques. It is concluded that the main-chain of PEN molecule in ultrathin film is prone to alignment parallel to the substrate when compared with thicker films. During the formation of α form crystalline, the naphthalene ring, the C O group in molecular chain of PEN as well as the b axis in crystalline tend to take orientation more parallel to the substrate due to the surface-induced effect. However, such an anisotropic structure could not be observed in the bulk PEN.