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Temperature Dependent Excess-Carrier Recombination Lifetime Study in Silicon Ingots and Bricks
Temperature Dependent Excess-Carrier Recombination Lifetime Study in Silicon Ingots and Bricks
2013
Ronald A. Sinton
James S. Swirhun
Adrienne L. Blum
Keywords:
Brick
Crystal
Recombination
Metallurgy
Materials science
Silicon
Correction
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