Vertical and Lateral Resolution in the CRS Method: A Practical Study

In this paper, we discuss the gain in vertical resolution and, maybe, loss of lateral resolution due to the application of the Common Reflection Surface (CRS) method. The CRS method strongly reduces the random noise, allows a better range of frequencies to recovery by, for example, a spectral whitening process. It is because CRS uses a larger number of traces than the CMP method to simulate the same ZO trace. But this larger sum, especially the lateral sum, maybe cause loss of lateral resolution. Using the SEG 3D model, CREWES 3C-3D Seismic Data Set, were done some tests applying the CRS method with different apertures and studied its effect in the Signal/Noise (S/N) ratio, and also in a synthetic trace was done a test to evaluate the capacity of CRS to recover a trace.