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Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope
Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope
2016
Ichiro Ohnishi
Kouji Miyatake
Yu Jimbo
Yorinobu Iwasawa
Masaki Morita
Takeo Sasaki
Hidetaka Sawada
Eiji Okunishi
Keywords:
Analytical chemistry
X-ray
Microscope
Materials science
Optics
Correction
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