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X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
2009
M. El Kazzi
G. Grenet
C. Merckling
Guillaume Saint-Girons
Claude Botella
O. Marty
G. Hollinger
Keywords:
Crystal growth
Thin film
Molecular beam epitaxy
Transmission electron microscopy
Nuclear magnetic resonance
X-ray crystallography
X-ray photoelectron spectroscopy
Diffraction
X-ray
Physics
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