Improving spatial resolution in X-ray microscopy by using tilted angle detector: A simulation study.

Conventional x-ray imaging detectors suffer from parallax error when the radiation beam arrives at the detector surface at tilted angle. The image blurring occurs as the radiation penetrates detector material in lateral direction at tilted angle. However, at the photon energies used in x-ray microscopy the attenuation length of the x-rays in the detector material is shorter and consequently the parallax error due to the tilted angle irradiation can be smaller. In these cases, the tilted angle irradiation can be beneficial because it will expand the beam projection ("footprint") at the detector surface, improve spatial resolution and help to overcome inherent resolution limit of the detector. We have performed a simulation study to investigate the above trade-off between the parallax error and improved spatial resolution when tilted angle irradiation is used. Our simulation study showed that tilted angle irradiation at 2-5keV x-ray energies can provide substantial improvements of spatial resolution. We used in our studies the indirect-conversion x-ray microscopy detectors based on scintillators optically coupled to CCD and CMOS cameras, as well as direct-conversion detectors based on back illuminated (back thinned) CCD and CMOS cameras. We have demonstrated also that the tilted angle irradiation can prevent radiation damage of the direct conversion back illuminated CCD and CMOS cameras due to the shallow x-ray attenuation depths with tilted angle geometry.