Preparation of Optical Quality ZnCdTe Thin Films by Vacuum Evaporation.
1998
A procedure to make optical quality thin films of
ZnxCd1-xTe by use of
vacuum evaporation of the ternary compound has been developed. The
starting point was the preparation of the compound that was then used
as the source in a simple vacuum evaporation system. The
characteristics of a film containing 85% ZnTe (x =
0.85) are presented. Electron microscope, atomic force
microscope, x-ray and optical spectral measurements were made. The
index of refraction was determined at room temperature from
transmittance measurements in the range of from 580 to 800 nm and was
found to agree within 1% with values found by others for single
crystals. We did this by assuming a Sellmeier equation and a known
index of refraction at infinite wavelength. The calculation also
yielded the roughness of the film.
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