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Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources
Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources
2020
Sebastian Siol
Jennifer Mann
John Newman
Takuya Miyayama
Katsumi Watanabe
Patrik Schmutz
Claudia Cancellieri
Lars P. H. Jeurgens
Keywords:
Analytical chemistry
Chemical state
X-ray
Chemistry
X-ray photoelectron spectroscopy
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