Special circuit for time parameter tests of analog integrated circuit test system

A special circuit for time parameter tests of an analog integrated circuit test system comprises a precise DA (digital-analog) conversion module, an input signal processing module, a trigger module and a high-speed counting module. The precise DA conversion module and the input signal processing module are connected with the trigger module, and the trigger module is connected with the high-speed counting module. Compared with the prior art, the special circuit has the advantages of 1 reasonable design, 2 high integration level and 3 wide parameter measurement range, and parameter measurement precision and measurement extension are improved greatly since the special circuit adopts the large-scale integrated circuit and the high-speed comparison trigger.