Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.