Statistical techniques for MMIC design sensitivity and chip yield analysis

This paper describes the first application of Taguchi SDOE to the sensitivity analysis of a MMIC amplifier. The technique demonstrates clearly which of the simulated performance parameters, including the one dB compression point derived from non-linear simulation, are sensitive to which of the device matching elements. The adaptability of the Taguchi technique is also demonstrated by applying it to the tolerance analysis of the same MMIC. Correlation of some of the HEMT parameters is now taken into account by the analysis, and the results are compared to those obtained by a fully correlated database sampling technique.