A new contingent algorithm for static automatic perimetry based upon chain pattern analysis

This communication introduces the term, ‘Chain Pattern’, and shows how analysis of the static automatic perimetric data embedded in chain patterns can help 1. use all equally valid and relevant data to find thresholds which are reproducible enough to serve as standards for comparison, 2. quantitate the rate of internal inconsistencies during static automatic perimetry, 3. design and refine a more efficient algorithm, and 4. provide a ‘report card’ on the accuracy and short-term stability of each threshold on the numerical printout.