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XAFS studies on GeSn thin-film grown by MOCVD method
XAFS studies on GeSn thin-film grown by MOCVD method
2016
Koji Usuda
Masahiko Yoshiki
Kohei Suda
Atsushi Ogura
Mitsuhiro Tomita
Keywords:
Thin film
Metalorganic vapour phase epitaxy
X-ray absorption fine structure
Analytical chemistry
Materials science
Synchrotron radiation
Optoelectronics
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