Photoluminescence properties of ultrathin CdSe layer depositions in ZnSe matrix

The photoluminescence properties of ultrathin CdSe layer were reported in this paper. Several monolayers of CdSe well layer were deposited in ZnSe matrix by lower-pressure metalorganic chemical vapor deposition. Two peaks were observed in the ultrathin structure. It was considered that the high-energy peak came from the exciton combination in the ultrathin CdSe well layer and the low-energy peak might come from the interface or impurity. The decrease of growth periods could lead the peak value of exciton peak red shift and the full-width at half-maximum become narrow. This was codetermined by the effect of interdiffusion and interface roughness or well width fluctuation.