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Structural characterization of InGaN/GaN multi-quantum well structures using high-resolution XRD
Structural characterization of InGaN/GaN multi-quantum well structures using high-resolution XRD
2003
Young Hoon Kim
Chang Soo Kim
S. K. Noh
S. I. Ban
Sung Gu Kim
K. Y. Lim
Byungsung O
Keywords:
Physics
Nuclear magnetic resonance
Quantum well
Condensed matter physics
high resolution
Correction
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