Tc DECAY BY THERMAL HYSTERESIS ON RESISTIVITY MEASUREMENT OF Bi-Pb-Sr-Ca-Cu-O.

1994 
The T c decay by thermal hysteresis on electrical resistivity measurement is investigated of Bi-Pb-Sr-Ca-Cu-O. If the measurement of the electrical resistivity is performed below 200 K, the later runs (N=2, 3 and 4) are smaller than that of the first run (n=1). The T c mid value doesn't greatly change by the measurement below 150 K.
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