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In situ spectroscopic ellipsometry for real time composition control of Hg 1-xCd xTe grown by molecular beam epitaxy
In situ spectroscopic ellipsometry for real time composition control of Hg 1-xCd xTe grown by molecular beam epitaxy
1997
R. Dat
F. Aqariden
W. M. Duncan
D. Chandra
H. D. Shih
Keywords:
Molecular beam epitaxy
In situ
Analytical chemistry
spectroscopic ellipsometry
Composition (visual arts)
Materials science
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