Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770 K

Abstract We use synchrotron-based energy-dispersive X-ray diffraction to study in real-time the phase transformations during the incorporation of thermally evaporated In into a thin Cu film at 770 K. Most of the phase transitions are in agreement with the Cu–In phase diagram. We measure a linear increase of the relative lattice expansion of the α -Cu(In) and δ -Cu 7 In 3 phases as In is incorporated into them. A radical change in the preferred orientation of the grains is observed at an In concentration of 37 at.% which we explain with the appearance of a liquid phase. In contrast to the phase diagram, we do not observe any crystalline phases for In concentrations higher than 52 at.%.