Failure Analysis Methodology of Blue LEDs

Focused on the description of the basic tools required for failure analysis of optoelectronic components for an InGaN/GaN MQW structure. In particular, we have presented two methods (electrical and optical) for measuring the junction temperature. We have shown that this parameter, as well as information provided by the physicochemical analyses, represents major points in the preparation of electrical and optical models of both types of the studied structures. Thermal, electro-optical and physicochemical analyses have demonstrated the wealth of information provided in order to develop a complete physical model.