Devices for low frequency stroboscopic x-ray diffraction imaging

Two stroboscopic shutters, adapted for the study of periodic phenomena in the 1–400 Hz range, were developed and tested. The principle, advantages and drawbacks of these devices are pointed out. Results obtained by x-ray diffraction imaging (topography) on a vibrating silicon crystal, and on the investigation of defects produced in KTiOPO4 by the application of an electric field, illustrate the possibilities of this stroboscopic imaging technique at low frequencies.