An Investigation on X-ray Reflectivity technique at LLNL
2016
This report documents the work carried out to determine the feasibility of using this technique for Pu oxide grown on bulk Pu system. It also provides the experimental and theoretical considerations in carrying out XRR technique to determine film thicknesses. The intention of this work is to develop the methodology and understand the limits for carrying out such experiments using the in-house technique.
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