Generalized Heterodyne Configurations for Photo-induced Force Microscopy

Infrared chemical microscopy through mechanical probing of light–matter interactions by atomic force microscopy (AFM) bypasses the diffraction limit. One increasingly popular technique is photoinduced force microscopy (PiFM), which utilizes the mechanical heterodyne signal detection between cantilever mechanical resonant oscillations and the photoinduced force from the light–matter interaction. So far, PiFM has been operated in only one heterodyne configuration. In this Article, we generalize heterodyne configurations of PiFM by introducing two new schemes: harmonic heterodyne detection and sequential heterodyne detection. In harmonic heterodyne detection, the laser repetition rate matches integer fractions of the difference between the two mechanical resonant modes of the AFM cantilever. The high harmonic of the beating from the photothermal expansion mixes with the AFM cantilever oscillation to provide the PiFM signal. In sequential heterodyne detection, the combination of the repetition rate of laser p...