Old Web
English
Sign In
Acemap
>
Paper
>
A Generation System for Inspection Algorithm Based on Sample Products' Images
A Generation System for Inspection Algorithm Based on Sample Products' Images
1992
Naoaki Tanizaki
Tetsuya Okamura
Tohru Murakami
Keywords:
Computer graphics (images)
Automated X-ray inspection
Automated optical inspection
Computer vision
Image processing
Computer science
Artificial intelligence
Human interface device
support system
Correction
Source
Cite
Save
Machine Reading By IdeaReader
1
References
0
Citations
NaN
KQI
[]