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The study of the optical properties of In0.52(Alx Ga1-x)0.48As by variable angle spectroscopic ellipsometry
The study of the optical properties of In0.52(Alx Ga1-x)0.48As by variable angle spectroscopic ellipsometry
1995
J.-W. Pan
J. L. Shieh
J.-H. Gau
J.-I. Chyi
Keywords:
Ellipsometry
Refractive index
Optics
Materials science
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