Examination of SMA connector parameters

This paper describes two different methods for examination of SMA connector properties. One method is based on measurement of connector scattering parameters and the second method is based on measurement of frequency dependent input impedance of manufactured sample. The sample consists of short microstrip line segment with 50 Ω characteristic impedance and of two edge mounted SMA connectors. The properties of connector are expressed as its scattering parameters or its parasitic elements which go out from the equivalent circuit diagram of connector.