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Accurate modelling of 3D-trench silicon sensor with enhanced timing performance and comparison with test beam measurements
Accurate modelling of 3D-trench silicon sensor with enhanced timing performance and comparison with test beam measurements
2021
Davide Brundu
Alessandro Cardini
Gian Matteo Cossu
G.-F. Dalla Betta
Michela Garau
Adriano Lai
Andrea Lampis
A Loi
M. M. Obertino
B. G. Siddi
S. Vecchi
Keywords:
Optoelectronics
Trench
test beam
Materials science
Silicon
Correction
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