Old Web
English
Sign In
Acemap
>
Paper
>
Investigation of Low-Energy H and He Implanted 4H-SiC using X-Ray and Neutron Reflectivity
Investigation of Low-Energy H and He Implanted 4H-SiC using X-Ray and Neutron Reflectivity
2021
Mitchel Vaninger
Alessandro R. Mazza
Thomas Ward
Helmut Kaiser
Thomas Heitmann
Katherine G. Schaefer
Gavin M. King
Edward H. Conrad
Paul F. Miceli
Keywords:
Reflectivity
Analytical chemistry
Neutron
Materials science
X-ray
low energy
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]