Old Web
English
Sign In
Acemap
>
Paper
>
Effects of Pulsed and DC Body-Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics
Effects of Pulsed and DC Body-Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics
2020
Ronald Green
Aivars J. Lelis
Franklin L. Nouketcha
Keywords:
Optoelectronics
Composite material
Diode
MOSFET
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
3
References
0
Citations
NaN
KQI
[]