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Si 1-x Ge x structures fabricated by focused ion beam implantation
Si 1-x Ge x structures fabricated by focused ion beam implantation
1998
Th. Ganetsos
Dimitris Tsamakis
D. Panknin
G. L. R. Mair
J. Teichert
L Bischoff
C. J. Aidinis
Keywords:
Ion beam
Optics
Focused ion beam
Ion beam deposition
Analytical chemistry
Chemistry
Correction
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