Hard X–ray Filter with Controllable Parameters

We consider the hard X–ray diffraction from reflecting atomic planes (1011) of X–cut quartz single crystal with different thicknesses in Laue geometry influenced by the temperature gradient. It has been experimentally proved that, depending on the value of the temperature gradient, the intensity of the reflected beam can be increased by orders of magnitude. It is shown that by using the temperature gradient it is possible to separate a beam with high angular and spectral width from the white beam and move it to the direction of reflection.