Rapid simulation method for anti-radiation property of field programmable gate array (FPGA)

The invention belongs to the technical field of electronics, and in particular relates to a rapid simulation method for the anti-radiation property of a field programmable gate array (FPGA). In the method, an error injection model which is unrelated to a specific hardware structure and is based on weight is put forward, and is used for simulating the anti-radiation property of the FPGA based on an SRAM (static random access memory) accurately; and simultaneously, an error injection simulation platform based on a JTAG(joint test action group) boundary scanning technique and a dynamic partial reconfiguration technique is put forward. The error injection system combining the error injection model and the error injection simulation platform, not only has favorable universality, but also can carry out simulation more accurately and more efficiently; and simultaneously, the cost is much lower.