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Direct Measurement of Band Edge Profiles at Epitaxial Oxide/Semiconductor Heterojunctions
Direct Measurement of Band Edge Profiles at Epitaxial Oxide/Semiconductor Heterojunctions
2019
Scott A. Chambers
Petr Sushko
Nicholas F. Quackenbush
Joseph C. Woicik
Zheng Hui Lim
M. Chrysler
Joseph H. Ngai
Tien-Lin Lee
J. M. Ablett
Mark Bowden
Zihua Zhu
Aubrey Penn
James M. LeBeau
Keywords:
oxide semiconductor
Heterojunction
Materials science
Edge (geometry)
Epitaxy
Optoelectronics
Correction
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