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The characterisation of Si/Si1–x Ge x superlattices by X-ray techniques
The characterisation of Si/Si1–x Ge x superlattices by X-ray techniques
2020
M. H. Lyons
M.A.G. Halliwell
C. G. Tuppen
C. J. Gibbings
Keywords:
Superlattice
Materials science
Crystallography
X-ray
Correction
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