Single event upset characterization of the Tegra K1 mobile processor using proton irradiation

Haibin Wang,Qingyu Chen,Li Chen,David M. Hiemstra,Valeri Kirischian

Single event upset characterization of the Tegra K1 mobile processor using proton irradiation

2017

Haibin Wang
Qingyu Chen
Li Chen
David M. Hiemstra
Valeri Kirischian

Vroton induced SEU cross-sections of Tegra K1 mobile processor are presented. Overall upset rates of Tegra K1 in the space radiation environment are estimated.

Keywords:

Electronic engineering
Embedded system
Upset
Radiation
Mobile processor
Irradiation
Engineering
Single event upset
Electrical engineering
Proton
space radiation

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