Probe separation and noise suppression in lensless microscopy

Lensless microscopy enables the recording of the image without the help of lens. However, it suffers from the undesired noise when the illumination is not uniform. Here, we present a novel technique to reconstruct both the illumination profile and the object in lensless microscopy based on what we call “separation method”. In this method, the background noise is separated and eliminated from the object and the quality of the image is improved. As a proof of this technique, we have done numerical simulation. The results indicate that the method has a promising potential in the suppression of noise under the situation of irregular illumination in lensless microscopy and also enables the retrieval of the incident wave field, which is of great importance as well as in electron and X-ray imaging.