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Reliability study of AlGaN/GaN HEMTs device
Reliability study of AlGaN/GaN HEMTs device
2007
Keiichi Matsushita
S. Teramoto
Hiroyuki Sakurai
Y. Takada
JeoungChill Shim
Hisao Kawasaki
Kunio Tsuda
Kazutaka Takagi
Keywords:
reliability study
thesaurus
algan gan
Engineering physics
Computer science
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