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Novel Trap Profiling in Nitride Layer Using Space Program for 3-D NAND Flash Memory
Novel Trap Profiling in Nitride Layer Using Space Program for 3-D NAND Flash Memory
2021
Jeong Soo Lee
Joung Hun Park
Gilsang Yoon
Jaeseok Jin
Donghyun Go
Keywords:
space program
Nitride
layer
Materials science
Trap (computing)
nand flash memory
Profiling (computer programming)
Optoelectronics
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