Old Web
English
Sign In
Acemap
>
Paper
>
XRD and XPS Analysis of TiO2 Thin Films Annealed in Different Environments
XRD and XPS Analysis of TiO2 Thin Films Annealed in Different Environments
2014
Tamara Potlog
Petru Dumitriu
Marius Dobromir
Dumitru Luca
Keywords:
Materials science
X-ray photoelectron spectroscopy
Thin film
Chemical engineering
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
4
Citations
NaN
KQI
[]