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Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
2012
J-W den Herder
L. Piro
T. Ohashi
L. Amati
J. Atteia
S. Barthelmy
Marco Barbera
D. Barret
S. Basso
Michel Boer
S. Borgani
O. Boyarskiy
E. Branchini
G. Branduardi–Raymont
M. S. Briggs
G. Brunetti
C. Budtz-Jorgensenf
D. N. Burrows
S. Campana
E. Caroli
Guido Chincarini
F. Christensen
M. Cocchi
A. Comastri
A. Corsi
Vincenzo Cotroneo
Paolo Conconi
L. Colasanti
G. Cusamano
A. De Rosa
M. Del Santo
S. Ettori
Yuichiro Ezoe
L. Ferrari
M. Feroci
Mark H. Finger
G. Fishman
Ryuichi Fujimoto
Massimiliano Galeazzi
A. Galli
F. Gatti
N. Gehrels
B. Gendre
G. Ghirlanda
G. Ghisellini
P. Giommi
M. Girardi
L. Guzzo
Francesco Haardt
I. Hepburn
Wim Hermsen
H. F. C. Hoevers
Andrew D. Holland
J. int Zand
Yoshitaka Ishisaki
Hajime Kawahara
Nobuyuki Kawai
Jelle S. Kaastra
Marc Kippen
P.A.J. de Korte
C. Kouveliotou
Alexander Kusenko
Claudio Labanti
Richard Lieu
C. Macculi
Kazuo Makishima
G. Matt
P. Mazotta
D. McCammon
Mariano Mendez
T. Mineo
S. Mitchell
K. Mitsuda
S. Molendi
Lauro Moscardini
R. F. Mushotzky
L. Natalucci
Fabrizio Nicastro
Paul T. O'Brien
J. P. Osborne
Frederik Paerels
Mat Page
S. Paltani
G. Pareschi
E. Perinati
C. Perola
T. J. Ponman
Andrew P. A Rasmussen
M. Roncarelli
Piero Rosati
Oleg Ruchayskiy
E. Quadrini
Ikuya Sakurai
R. Salvaterra
Shin Sasaki
G. Sato
Joop Schaye
J. Schmidtt
S. Scioritino
Mikhail Shaposhnikov
Keisuke Shinozaki
D. Spiga
Yasushi Suto
G. Tagliaferri
T. Takahashi
Yoh Takei
Yuzuru Tawara
P. Tozzi
Hiroshi Tsunemi
Takeshi Go Tsuru
P. Ubertini
Eugenio Ursino
Matteo Viel
J. Vink
N.E White
R. Willingale
R. A. M. J. Wijers
Kenichi Yoshikawa
Noriko Y. Yamasaki
Keywords:
Electrical engineering
Instrumentation
Physics
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