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Ultra high precision refractive index measurement of Si at $\gamma$-ray energies up to 2 MeV
Ultra high precision refractive index measurement of Si at $\gamma$-ray energies up to 2 MeV
2017
M. M. Günther
M. Jentschel
A. J. Pollitt
P. G. Thirolf
M. Zepf
Keywords:
Gamma ray
Analytical chemistry
Refractive index
Materials science
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