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28nmと14nm UTBB FDSOIノードにおける信頼性適応ボディバイアス方式と性能【Powered by NICT】
28nmと14nm UTBB FDSOIノードにおける信頼性適応ボディバイアス方式と性能【Powered by NICT】
2016
C. Ndiaye
V. Huard
X. Federspiel
F. Cacho
A. Bravaix
Keywords:
Computer engineering
Electronic engineering
Engineering
Reliability engineering
Systems engineering
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