Cross-sectional scanning tunneling microscopy of InGaAs quantum dots

Summary form only given. Topographic cross section scanning tunnelling microscope (X-STM) images show dot sizes of approximately 20 nm, consistent with atomic force microscopy measurements on similar samples. I-V measurements on the QDs feature a lower tunneling current turn-on for the dots than the surrounding areas. Tunneling-induced luminescence images from the surrounding layers provide additional information about carrier behavior within the system.