Cross-sectional scanning tunneling microscopy of InGaAs quantum dots
1998
Summary form only given. Topographic cross section scanning tunnelling microscope (X-STM) images show dot sizes of approximately 20 nm, consistent with atomic force microscopy measurements on similar samples. I-V measurements on the QDs feature a lower tunneling current turn-on for the dots than the surrounding areas. Tunneling-induced luminescence images from the surrounding layers provide additional information about carrier behavior within the system.
Keywords:
- Scanning probe microscopy
- Physics
- Scanning tunneling spectroscopy
- Optics
- Electrochemical scanning tunneling microscope
- Spin polarized scanning tunneling microscopy
- Scanning capacitance microscopy
- Conductive atomic force microscopy
- Photoconductive atomic force microscopy
- Scanning gate microscopy
- Scanning tunneling microscope
- Optoelectronics
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