Titanium-deposition assisted brazing of SiC ceramics using inactive AgCu filler

Abstract In this study, active titanium element film was designed to deposit on SiC ceramics directly to enhance the brazability of inactive AgCu brazing alloy on ceramics. The result showed the reliable joint was successfully obtained and the deposition of titanium film on SiC directly inhibited the formation of amounts of intermetallic compounds effectively in the brazing seam. Detailed interfacial microstructure of joint investigated by scanning electron microscope equipped with energy dispersive spectrum analysis and transmission electron microscope revealed that the interfacial reactions were based on deposited Ti film. The typical joint was SiC/TiCu + Ti 2 Cu/TiC/Ti 5 Si 3 containing TiC particles/Ag(s,s) + Cu(s,s)/Ti 5 Si 3 containing TiC particles/TiC/TiCu + Ti 2 Cu/SiC.