Research on PCB Micrograph Registration Based on FSK Method

To realize automatic optical visual inspection (AOI) in the high resolution image for image matching, the extraction and registration of feature points is critical. The traditional image registration algorithm is time-consuming, computationally intensive and ineffective. In this paper, an optimization algorithm based on FAST, SURF and K-Means algorithms is proposed to optimize the feature point selection and reduce the matching point pairs. The algorithm uses the FAST algorithm to extract the feature points, and then generates the SURF descriptors according to the information in the fields around the feature points, and the K-Means algorithm is used to cluster the feature points. Finally, the error matching points are eliminated by the consistency check. The experimental results show that the proposed algorithm has high speed and precision in extracting the feature points.