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Measuring the Unoccupied Band Structure with ~10nm Lateral Resolution
Measuring the Unoccupied Band Structure with ~10nm Lateral Resolution
2018
Johannes Jobst
Jaap Kautz
Jesse Balgley
Eugene E. Krasovskii
Cory Dean
Rudolf M. Tromp
Sense Jan van der Molen
Keywords:
Optoelectronics
Materials science
Electronic band structure
Correction
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