X-ray and Auger microprobe studies of vanadium-doped layered chromium-copper disulfide crystals

In the work, X-ray and Auger microprobe studies of the surface of crystals prepared from powder samples of CuCr1−x V x S2 disulfides (x = 0÷0.11) by crystallization from melt in the sulfur vapor atmosphere. Sample slabs cut from ingots include crystalline layered blocks with different orientation of copper-containing extended linear inclusions separated by disulfide matrix layers. The results of the microprobe analysis of regions with copper-containing inclusions and the regions adjacent to them are presented.