YBCO step edge junctions on various substrates

We have fabricated YBCO 90/spl deg/ grain boundary junctions on step edges in NdGaO/sub 3/ and in deposited dielectric (CeO/sub 2/ on YSZ and SrTiO/sub 3/ on MgO) in order to compare junction performance to our standard, LaAlO/sub 3/. Average I/sub c/R/sub n/ values at 77 K in the 300-400 /spl mu/V range were measured for 2 /spl mu/m step edge junctions on NdGaO/sub 3/, LaAlO/sub 3/, and SrTiO/sub 3//MgO. Junction I/sub c/ is greatly reduced with the CeO/sub 2//YSZ system. I/sub c/R/sub n/ values in the 300-400 /spl mu/V range were measured at 65 K for 4 /spl mu/m junctions. >