Current-induced stabilization of surface morphology in stressed solids: Validation of linear stability theory

Results are reported of a comprehensive analysis of the surface morphological response of an electrically conducting crystalline solid under the simultaneous action of an electric field and mechanical stress. The analysis is based on self-consistent dynamical simulations according to a fully nonlinear model of driven surface morphological evolution in conjunction with linear stability theory. The possibility is examined of current-induced stabilization of the surface morphology due to surface electromigration in stressed conductors that, in the absence of the electric current, would undergo cracklike surface instabilities. Current-induced surface stabilization of stressed solids is demonstrated and the corresponding stability domain boundaries are determined over a range of electromechanical conditions. Systematic comparisons are carried out of the numerical simula-tion results with the predictions of the linear stability theory and are used to establish the range of validity of the linear stability theory.